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锐峰先科技术有限公司

BE FIRST TECHNOLOGY CO., LTD

SURAGUS EddyCus TF lab 2020 Sheet Resistance Tester

The EddyCus TF lab 2020 allows manual single point measurements of conductive thin films and layer thickness measurement of thin metal layers in non-contact mode. 

SURAGUS EddyCus TF map 2530 Sheet Resistance Tester

The Eddy­Cus® TF map 2530 Series auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 300 x 300 mm² (12 x 12 inches) in non-con­tact mode. 

SURAGUS EddyCus TF inline Sheet Resistance Tester

The EddyCus TF inline series measures layer properties such as metal layer thickness or sheet resistance in non-contact on various substrates. Typical substrates are glass, foil, paper, wafer, plastic or ceramic.