TESCAN VEGA Scanning electron microscopy
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software.
High resolution field emission scanning electron microscope (SEM)
Tescan's SEM platforms provide high - resolution imaging and surface analysis with exceptional contrast, detail, and ease of use - ideal for materials research, quality control, and analytical applications.
Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)
Tescan FIB-SEM systems combine fast, precise milling with high - resolution imaging and advanced automation. Choose from Ga+ or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
TENSOR 4D Multimodal Analytical STEM
Tescan's TENSOR is the first fully integrated and synchronized analytical STEM platform built for intuitive multimodal nanocharacterization of a wide variety of samples, combining structural, morphological, and chemical insights.
Micro-computed tomography (microCT)
Tescan's X - ray micro-CT systems deliver fast, high - resolution 3D and 4D imaging for non - destructive internal analysis. Dynamic in - situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.
TIMA-X mineral analysis system
TIMA-X is an automated mineralogy system for fast quantitative analysis of samples such as rocks, ores, concentrates, tailings, leach residues or smelter products.
RISE Integrated Raman integrated microscope
RISE integrated Raman microscopy has been widely used in various fields such as geology, mineral crystals, polymer materials, medicine, life sciences, and gemstone identification.