D9650 C-SAM Scanning Acoustic Microscope
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched.
Gen7 C-SAM Scanning Acoustic Microscope
The Gen7 C-SAM is the latest generation in Acoustic Micro Imaging. Built on the advancement made by its predecessors, the Gen7 delivers the most advanced hardware available on a C-SAM instrument. The advanced hardware allows for new features and analysis that can now be completed faster than ever before.
DF2400 FACTS² C-SAM Automated Scanning Acoustic Microscope
The DF2400 FACTS² delivers state-of-the-art, automated in-line inspection for quality and process control. Equipped with our industry preferred Sonolytics software platform, the DF2400 is the ideal solution for production environments.
AW Series C-SAM Automated Scanning Acoustic Microscope
The AW series is designed to handle wafer level products (BSI sensors, SOI, MEMS, LEDs, Chip-on-Wafer and Unpolished Wafers) manufactured by virtually any method, including bonding processes using direct fusion, anodic, glass frit and epoxy bonding.
SpinSAM C-SAM Automated Scanning Acoustic Microscope
The SpinSAM automated inspection tool delivers high throughput and better sensitivity for accurately locating defects in wafer based assemblies. Ideal applications include bonded wafers, Chip-on-Wafer, stacked wafers, MEMS, over-molded wafers and more.