D9650 C-SAM Scanning Acoustic Microscope (with wafer fixture)
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched.
Gen7 C-SAM Scanning Acoustic Microscope (with wafer fixture)
The Gen7 C-SAM is the latest generation in Acoustic Micro Imaging. Built on the advancement made by its predecessors, the Gen7 delivers the most advanced hardware available on a C-SAM instrument. The advanced hardware allows for new features and analysis that can now be completed faster than ever before.
AW Series C-SAM Scanning Acoustic Microscope
The AW series is designed to handle wafer level products (BSI sensors, SOI, MEMS, LEDs, Chip-on-Wafer and Unpolished Wafers) manufactured by virtually any method, including bonding processes using direct fusion, anodic, glass frit and epoxy bonding.