锐峰先科技术有限公司

Immersion UHR SEM for contrast-critical nanoscale imaging and STEM-in-SEM analysis

Tescan MAGNA gives you TriLens™ immersion optics and energy-selective detectors that produce clear, unmixed contrast at high resolution. You can maintain image quality at long working distances and on tilted surfaces, enabling detailed analysis of cross-sections, nanomaterials, and complex failure features.

Key benefits

• Clear SE/BSE contrast: TriSE™ and TriBE™ detectors provide well-defined signals so you can distinguish surface and compositional information with confidence.
• High resolution at long working distances: Stable sub-nanometer performance supports your work on complex sample geometries and challenging orientations.
• STEM-in-SEM capability: Integrated STEM-in-SEM lets you perform advanced nanoscale characterization without switching platforms.