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锐峰先科技术有限公司

BE FIRST TECHNOLOGY CO., LTD

S wide Large Area 3D Profiler


 

 

 

 

 

It only takes one second to acquire. With S wide’s Fringe Projection technology and a suite of different acquisition modes, the measurements can be optimized to achieve the highest throughput.

 

Easy to use
Measuring with the S wide is as simple as it gets: load the sample, load the recipe, and check the results.

 

HIGH-RESOLUTION 3D IMAGING
Capture every detail
This 3D scanner features a 5 MPx color camera that, along with its digital zoom capabilities, captures a variety of details on your inspected parts.

 

INDUSTRIAL METROLOGY SOLUTIONS
Large setups
Measure numerous arrays of samples and large areas thanks to the 300 x 300 mm stage configuration.

 

PRECISION OPTICAL MEASUREMENT
Submicron repeatability 
The proprietary Fringe Projection algorithms used by the S wide result in remarkable micron-level accuracy, providing unmatched submicron height repeatability across expansive measurement surfaces.

 

ADVANCED SOFTWARE TOOLS
Meaningful data extraction 
The S wide is packed with a suite of analysis tools to extract every piece of information from the measured data: roughness and flatness parameters, critical dimensions, GD&T, and CAD comparisons.